(832) 252-7200

XRF



X-ray fluorescence (XRF) analysis provides quantitative information on the elemental composition of a sample. In XRF the sample is irradiated with radiation from a primary x-ray source causing electrons to be emitted from atoms in the sample. As the atoms return to their original state energy is released in the form of secondary or fluorescent x-rays which can be detected. Each atom produces its own characteristic fluorescent x-rays enabling us to identify the element whilst the intensity of the radiation is used to determine the concentration of each element present.
XRF is used as a tool for identification of either the major or minor/trace elements present depending on how the sample is prepared and the calibration of the XRF instrument. Element analysis is performed using the ED-XRF (energy dispersive), the sample having been machine milled, mixed with a water based binder and then pressed into a pellet using a hydraulic press.
Recent advances in XRF technology have led to small hand held units. These portable units are restricted in their analytical capabilities but do enable very high resolution geochemical data down cored sections to be gathered very quickly and without any sample destruction. HHXRF units are particularly useful in shale resource plays proving rapid lithological information, facies data and a means to calculate RBi.
Benchtop X-Ray Fluorescence
Our benchtop XRF systems are fully portable, yet provide data of similar quality to larger laboratory-based instruments. They can be used to provide data directly from cuttings samples with no sample destruction in storage facilities or at well-site



